Image |
Référence |
Fabricant |
Description |
paquet |
Stock |
Quantité |
Voltage - DC Reverse (Vr) (Max) | Current - Average Rectified (Io) | Voltage - Forward (Vf) (Max) @ If | Speed | Reverse Recovery Time (trr) | Current - Reverse Leakage @ Vr | Capacitance @ Vr, F | Mounting Type | Package / Case | Supplier Device Package | Operating Temperature - Junction |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Microsemi Corporation |
DIODE GEN PURP 600V 35A DO5
|
paquet: DO-203AB, DO-5, Stud |
Stock6 540 |
|
600V | 35A | 1.4V @ 110A | Fast Recovery =< 500ns, > 200mA (Io) | - | 10µA @ 600V | - | Stud Mount | DO-203AB, DO-5, Stud | DO-5 | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 200V 30A DO4
|
paquet: DO-203AA, DO-4, Stud |
Stock6 960 |
|
200V | 30A | 975mV @ 30A | Fast Recovery =< 500ns, > 200mA (Io) | 35ns | 15µA @ 200V | 140pF @ 10V, 1MHz | Chassis, Stud Mount | DO-203AA, DO-4, Stud | DO-4 | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE SCHOTTKY 45V 54A DO5
|
paquet: DO-203AB, DO-5, Stud |
Stock6 608 |
|
45V | 54A | 820mV @ 120A | Fast Recovery =< 500ns, > 200mA (Io) | - | 2mA @ 45V | 3000pF @ 5V, 1MHz | Chassis, Stud Mount | DO-203AB, DO-5, Stud | DO-5 | -55°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 1KV 3A AXIAL
|
paquet: Axial |
Stock7 032 |
|
1000V | 3A | 1V @ 3A | Fast Recovery =< 500ns, > 200mA (Io) | - | 25µA @ 1000V | - | Through Hole | Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 300V 3A AXIAL
|
paquet: B, Axial |
Stock9 228 |
|
300V | 3A | 1.25V @ 3A | Fast Recovery =< 500ns, > 200mA (Io) | 50ns | 20µA @ 300V | - | Through Hole | B, Axial | - | -55°C ~ 150°C |
||
Microsemi Corporation |
DIODE GEN PURP 100V 2.5A A-MELF
|
paquet: SQ-MELF, A |
Stock7 392 |
|
100V | 2.5A | - | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 2µA @ 100V | 3.5pF @ 6V, 1MHz | Surface Mount | SQ-MELF, A | A-MELF | 150°C (Max) |
||
Microsemi Corporation |
DIODE GEN PURP 150V 2.5A A-MELF
|
paquet: SQ-MELF, A |
Stock5 552 |
|
150V | 2.5A | 975mV @ 2A | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 2µA @ 150V | - | Surface Mount | SQ-MELF, A | A-MELF | 175°C (Max) |
||
Microsemi Corporation |
DIODE GEN PURP 200V 1A AXIAL
|
paquet: A, Axial |
Stock6 036 |
|
200V | 1A | 1.25V @ 1A | Fast Recovery =< 500ns, > 200mA (Io) | 50ns | 10µA @ 200V | - | Through Hole | A, Axial | - | -55°C ~ 150°C |
||
Microsemi Corporation |
DIODE GEN PURP 150V 850MA AXIAL
|
paquet: A, Axial |
Stock3 792 |
|
150V | 850mA | 2.04V @ 9.4A | Fast Recovery =< 500ns, > 200mA (Io) | 30ns | 1µA @ 150V | - | Through Hole | A, Axial | A-PAK | -65°C ~ 155°C |
||
Microsemi Corporation |
DIODE GEN PURP 600V 500MA D5A
|
paquet: SQ-MELF, A |
Stock5 200 |
|
600V | 500mA (DC) | 1V @ 400mA | Fast Recovery =< 500ns, > 200mA (Io) | - | 50nA @ 600V | - | Surface Mount | SQ-MELF, A | D-5A | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 100V 1A AXIAL
|
paquet: A, Axial |
Stock6 832 |
|
100V | 1A | 975mV @ 1A | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 2µA @ 100V | - | Through Hole | A, Axial | - | -55°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 200A B-MELF
|
paquet: SQ-MELF, B |
Stock6 112 |
|
- | 200A (DC) | 1V @ 200mA | Standard Recovery >500ns, > 200mA (Io) | 3µs | 1nA @ 125V | - | Surface Mount | SQ-MELF, B | B, SQ-MELF | -65°C ~ 150°C |
||
Microsemi Corporation |
DIODE GEN PURP 660V 1.75A A-MELF
|
paquet: SQ-MELF, A |
Stock7 376 |
|
660V | 1.75A | 1.35V @ 2A | Fast Recovery =< 500ns, > 200mA (Io) | 30ns | 2µA @ 660V | 40pF @ 10V, 1MHz | Surface Mount | SQ-MELF, A | A-MELF | -65°C ~ 150°C |
||
Microsemi Corporation |
DIODE GEN PURP 400V 1A AXIAL
|
paquet: A, Axial |
Stock6 560 |
|
400V | 1A | 1.3V @ 3A | Standard Recovery >500ns, > 200mA (Io) | 2µs | 500nA @ 400V | - | Through Hole | A, Axial | - | -65°C ~ 200°C |
||
Microsemi Corporation |
DIODE GEN PURP 200V 5A AXIAL
|
paquet: B, Axial |
Stock6 720 |
|
200V | 5A | 1.2V @ 9A | Standard Recovery >500ns, > 200mA (Io) | 2µs | 1µA @ 200V | - | Through Hole | B, Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 1KV 1A AXIAL
|
paquet: A, Axial |
Stock5 104 |
|
1000V | 1A | 1.3V @ 3A | Standard Recovery >500ns, > 200mA (Io) | 2µs | 500nA @ 1000V | - | Through Hole | A, Axial | - | -65°C ~ 200°C |
||
Microsemi Corporation |
DIODE GEN PURP 500V 3A AXIAL
|
paquet: B, Axial |
Stock6 048 |
|
500V | 3A | 1.5V @ 9A | Fast Recovery =< 500ns, > 200mA (Io) | 250ns | 1µA @ 500V | - | Through Hole | B, Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 50V 1A AXIAL
|
paquet: A, Axial |
Stock6 608 |
|
50V | 1A | 875mV @ 1A | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 1µA @ 50V | 25pF @ 10V, 1MHz | Through Hole | A, Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 200V 3A D5B
|
paquet: E-MELF |
Stock6 096 |
|
200V | 3A | 1.5V @ 9A | Fast Recovery =< 500ns, > 200mA (Io) | 150ns | 1µA @ 200V | - | Surface Mount | E-MELF | D-5B | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 800V 3A B-MELF
|
paquet: SQ-MELF, B |
Stock7 032 |
|
800V | 3A | 1.2V @ 9A | Standard Recovery >500ns, > 200mA (Io) | 2µs | 1µA @ 800V | - | Surface Mount | SQ-MELF, B | B, SQ-MELF | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 800V 1A E3
|
paquet: E3 |
Stock6 228 |
|
800V | 1A | 1.3V @ 3A | Standard Recovery >500ns, > 200mA (Io) | 5µs | 1µA @ 800V | - | - | E3 | E3 | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 180V 200MA DO213
|
paquet: DO-213AA |
Stock7 440 |
|
180V | 200mA | 1V @ 100mA | Small Signal =< 200mA (Io), Any Speed | - | 100µA @ 180V | - | Surface Mount | DO-213AA | DO-213AA | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 500V 3A AXIAL
|
paquet: B, Axial |
Stock8 292 |
|
500V | 3A | 1.5V @ 9A | Fast Recovery =< 500ns, > 200mA (Io) | 250ns | 1µA @ 500V | - | Through Hole | B, Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE SCHOTTKY 70V 33MA DO35
|
paquet: DO-204AH, DO-35, Axial |
Stock9 012 |
|
70V | 33mA | 1V @ 15mA | Small Signal =< 200mA (Io), Any Speed | - | 200nA @ 70V | 2pF @ 0V, 1MHz | Through Hole | DO-204AH, DO-35, Axial | DO-35 | -65°C ~ 150°C |
||
Microsemi Corporation |
DIODE GEN PURP 200V 1A AXIAL
|
paquet: A, Axial |
Stock5 744 |
|
200V | 1A | 1.3V @ 3A | Standard Recovery >500ns, > 200mA (Io) | 2µs | 500nA @ 200V | - | Through Hole | A, Axial | - | -65°C ~ 200°C |
||
Microsemi Corporation |
DIODE GEN PURP 600V 1A AXIAL
|
paquet: A, Axial |
Stock7 776 |
|
600V | 1A | 1.6V @ 3A | Fast Recovery =< 500ns, > 200mA (Io) | 250ns | 500nA @ 800V | - | Through Hole | A, Axial | - | -65°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 400V 60A TO247
|
paquet: TO-247-2 |
Stock5 792 |
|
400V | 60A | 1.5V @ 60A | Fast Recovery =< 500ns, > 200mA (Io) | 37ns | 250µA @ 400V | - | Through Hole | TO-247-2 | TO-247 [B] | -55°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 1KV 60A TO247
|
paquet: TO-247-2 |
Stock6 264 |
|
1000V | 60A | 3V @ 60A | Fast Recovery =< 500ns, > 200mA (Io) | 255ns | 100µA @ 1000V | - | Through Hole | TO-247-2 | TO-247 [B] | -55°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 200V 30A TO247
|
paquet: TO-247-2 |
Stock10 632 |
|
200V | 30A | 1.3V @ 30A | Fast Recovery =< 500ns, > 200mA (Io) | 24ns | 250µA @ 200V | - | Through Hole | TO-247-2 | TO-247 [B] | -55°C ~ 175°C |
||
Microsemi Corporation |
DIODE GEN PURP 1.2KV 30A TO247
|
paquet: TO-247-2 |
Stock49 356 |
|
1200V | 30A | 3.3V @ 30A | Fast Recovery =< 500ns, > 200mA (Io) | 320ns | 100µA @ 1200V | - | Through Hole | TO-247-2 | TO-247 [B] | -55°C ~ 175°C |